DocumentCode
3578090
Title
A verification methodology for reusable test cases and coverage based on system verilog
Author
Lingling Chai ; Zheng Xie ; Xin´an Wang
Author_Institution
Key Lab. of Integrated Microsyst., Peking Univ., Shenzhen, China
fYear
2014
Firstpage
1
Lastpage
2
Abstract
As the size and complexity of SoC design grow, it is common to establish a scalable and reusable verification test bench for verification engineers. To improve the efficiency of verification and reduce the development time and effort in chip design projects, the extensive and reusable test case model and function coverage model for the special circuit and the standard protocols should be focused on by verification engineers. In this paper, a verification methodology for reusable test cases and coverage is described. As an example, a reusable test bench of chain table DUT is utilized to verify the feasibility of the verification methodology.
Keywords
formal verification; hardware description languages; integrated circuit testing; logic testing; DUT; functional coverage; reusable test cases; system verilog; verification methodology; Chip scale packaging; Generators; Hardware design languages; Integrated circuit modeling; Monitoring; Protocols; Standards; Functional Coverage; Reusability; Test Case; Verification Methodology;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices and Solid-State Circuits (EDSSC), 2014 IEEE International Conference on
Type
conf
DOI
10.1109/EDSSC.2014.7061166
Filename
7061166
Link To Document