• DocumentCode
    3578090
  • Title

    A verification methodology for reusable test cases and coverage based on system verilog

  • Author

    Lingling Chai ; Zheng Xie ; Xin´an Wang

  • Author_Institution
    Key Lab. of Integrated Microsyst., Peking Univ., Shenzhen, China
  • fYear
    2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    As the size and complexity of SoC design grow, it is common to establish a scalable and reusable verification test bench for verification engineers. To improve the efficiency of verification and reduce the development time and effort in chip design projects, the extensive and reusable test case model and function coverage model for the special circuit and the standard protocols should be focused on by verification engineers. In this paper, a verification methodology for reusable test cases and coverage is described. As an example, a reusable test bench of chain table DUT is utilized to verify the feasibility of the verification methodology.
  • Keywords
    formal verification; hardware description languages; integrated circuit testing; logic testing; DUT; functional coverage; reusable test cases; system verilog; verification methodology; Chip scale packaging; Generators; Hardware design languages; Integrated circuit modeling; Monitoring; Protocols; Standards; Functional Coverage; Reusability; Test Case; Verification Methodology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits (EDSSC), 2014 IEEE International Conference on
  • Type

    conf

  • DOI
    10.1109/EDSSC.2014.7061166
  • Filename
    7061166