Title :
An improved fast acquisition PFD with zero blind zone for the PLL application
Author :
Yi He ; Xiaole Cui ; Chung Len Lee ; Dongmei Xue
Author_Institution :
Key Lab. of Integrated Microsyst., Peking Univ., Shenzhen, China
Abstract :
An improved fast acquisition phase-frequency detector (PFD) for Phase-Locked Loop (PLL) is presented. The proposed PFD completely eliminates the blind zone, which is caused by the missing input edge during reset pulse. It has a linear output range and a saturated output when the phase error is in [0, π] and [π, 2π]. The simulation results with the SMIC 65nm CMOS technology file show that, comparing with the published works, the proposed nonlinear gain PFD has a faster lock process, and improves the maximum operating frequency to as higher as 1GHz.
Keywords :
CMOS integrated circuits; field effect MMIC; phase locked loops; CMOS technology; PLL application; fast acquisition PFD; phase frequency detector; phase locked loop; size 65 nm; zero lind zone; Frequency control; Nickel; Phase frequency detector; Voltage control; Blind zone; Lock process; PFD; PLL;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2014 IEEE International Conference on
DOI :
10.1109/EDSSC.2014.7061226
