• DocumentCode
    3578375
  • Title

    A large signal SDD model for InP DHBT

  • Author

    Oupeng Li ; Wei Cheng ; Lei Wang ; Haiyan Lu ; Ruimin Xu

  • Author_Institution
    Fundamental Sci. on EHF Lab., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2014
  • Firstpage
    183
  • Lastpage
    185
  • Abstract
    In this paper, a accuracy large-signal model based on agilentHBT model for InP dou-ble heterojunction bipolar transistors (DHBTs) is implemented as symbolically defined device (SDD) in Agilent ADS. The model accounts for most physical phenomena including the Kirk effect, soft knee effect, base collector capacitance and collector transit time. The validity and the accuracy of the large-signal model are assessed by comparing the simulation with the measurement of DC and multi-bias small S parameters for InP DHBTs.
  • Keywords
    III-V semiconductors; S-parameters; heterojunction bipolar transistors; indium compounds; semiconductor device models; Agilent ADS; DHBT; InP; Kirk effect; S parameters; base collector capacitance; collector transit time; double heterojunction bipolar transistors; large signal SDD model; soft knee effect; symbolically defined device; DH-HEMTs; Equations; Heterojunction bipolar transistors; Indium phosphide; Integrated circuit modeling; Junctions; Mathematical model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communication Problem-Solving (ICCP), 2014 IEEE International Conference on
  • Print_ISBN
    978-1-4799-4246-6
  • Type

    conf

  • DOI
    10.1109/ICCPS.2014.7062248
  • Filename
    7062248