DocumentCode
357862
Title
Analysis of PCB level EMI phenomena using an adaptive low-frequency plane wave time domain algorithm
Author
Aygün, K. ; Lu, M. ; Shanker, B. ; Michielssen, E.
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Volume
1
fYear
2000
fDate
2000
Firstpage
295
Abstract
A novel integral equation based algorithm is proposed that permits the analysis of PCB-level EMI phenomena. The algorithm is based on the multilevel plane wave time domain algorithm (PWTD). For a problem of N T temporal and NS spatial unknowns involving no sub-wavelength features, the multilevel PWTD algorithm reduces the O(N TNS2) computational cost of a classical marching-on-in-time (MOT) algorithm to O(NTNSlog 2NS). However, PCB structures with fine geometrical details such as very thin slots, closely spaced vias or pins, etc., call for a highly non-uniform spatial discretization of the problem domain. In such cases, a straightforward implementation of the multilevel PWTD scheme cannot achieve a reduced computational complexity. Here, an adaptive low-frequency PWTD algorithm is described to solve this problem. Numerical results are presented to demonstrate the applicability of the scheme to the EMI analysis of complex PCB problems
Keywords
adaptive systems; computational complexity; electromagnetic compatibility; electromagnetic interference; integral equations; printed circuits; time-domain analysis; 3D arbitrarily shaped PEC surfaces; CB problems; EMC; EMI analysis; PCB level EMI; adaptive LF plane wave time domain algorithm; adaptive low-frequency PWTD algorithm; closely spaced pins; closely spaced vias; computational complexity; computational cost reduction; electromagnetic compatibility; electromagnetic interference; fine geometrical details; full-wave analysis; integral equation based algorithm; marching-on-in-time algorithm; multilevel PWTD; multilevel plane wave time domain algorithm; nonuniform spatial discretization; very thin slots; wires; Algorithm design and analysis; Clocks; Computational complexity; Electromagnetic compatibility; Electromagnetic interference; Finite difference methods; Integral equations; Message-oriented middleware; Time domain analysis; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location
Washington, DC
Print_ISBN
0-7803-5677-2
Type
conf
DOI
10.1109/ISEMC.2000.875581
Filename
875581
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