Title : 
Internal EMC problems caused by parasitic resonances
         
        
            Author : 
Djordjevic, Antonije ; Maricevic, Zoran
         
        
            Author_Institution : 
Sch. of Electr. Eng., Belgrade Univ., Serbia
         
        
        
        
        
        
            Abstract : 
Parasitic coupling among components and circuits on the PCB of a high-frequency analog or digital device can distort transfer characteristics, cause errors in data transfer and processing, and jeopardize the stability of active components. Particularly strong coupling can occur due to parasitic resonances of various structures, including power-distribution conductors, coils, reactively terminated transmission lines, improperly grounded coaxial lines and other conductors mounted above the PCB, enclosures, etc. Such resonances must be predicted while designing the device, which is not a simple task. Their influence can be reduced to a tolerable level by increasing the resonant frequencies and by dampening the resonances by introducing losses
         
        
            Keywords : 
circuit resonance; coaxial cables; coils; electromagnetic compatibility; electromagnetic coupling; printed circuits; transmission line theory; PCB; active components; coils; dampening; data transfer; high-frequency analog device; high-frequency digital device; improperly grounded coaxial lines; internal EMC problems; losses; parasitic coupling; parasitic resonances; power-distribution conductors; reactively terminated transmission lines; resonant frequencies; transfer characteristics; Circuit stability; Coaxial components; Coils; Conductors; Coupling circuits; Distributed parameter circuits; Electromagnetic compatibility; Power transmission lines; Resonance; Resonant frequency;
         
        
        
        
            Conference_Titel : 
Electromagnetic Compatibility, 2000. IEEE International Symposium on
         
        
            Conference_Location : 
Washington, DC
         
        
            Print_ISBN : 
0-7803-5677-2
         
        
        
            DOI : 
10.1109/ISEMC.2000.875587