DocumentCode :
357870
Title :
Estimation of countermeasure effect by a bypass condenser at a source terminal of a CMOS IC
Author :
Kazama, Satoshi ; Shinohara, Shinichi ; Sato, Risaburo ; Shimizu, Masayuki
Author_Institution :
Electromagnetic Compatibility Res. Labs. Co. Ltd., Sendai, Japan
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
353
Abstract :
A method for measuring source pin current and an equivalent circuit for the source pin of a CMOS digital integrated circuit are proposed. This equivalent circuit includes the capacitance of the integrated circuit protection diode and the inductance of the lead frame. Using this equivalent circuit, the changes in terminal current that occur when countermeasure components such as a bypass capacitor are inserted can be estimated. The proposed current measurement method was used to verify this equivalent circuit. In addition, the relation between the source pin current and the radiated electromagnetic field was clarified. These results show that this equivalent circuit can be used to estimate the effect of inserting source pin countermeasure components on electromagnetic interference
Keywords :
CMOS digital integrated circuits; capacitance; capacitors; electric current measurement; electromagnetic fields; electromagnetic interference; equivalent circuits; inductance; interference suppression; semiconductor diodes; CMOS digital IC; CMOS digital integrated circuit; bypass capacitor; bypass condenser; capacitance; countermeasure effect estimation; current measurement method; electromagnetic interference; equivalent circuit; integrated circuit protection diode; lead frame inductance; radiated electromagnetic field; source pin countermeasure components; source pin current measurement; source terminal; terminal current; CMOS digital integrated circuits; Capacitance; Capacitors; Current measurement; Diodes; Electromagnetic fields; Equivalent circuits; Inductance; Integrated circuit measurements; Protection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5677-2
Type :
conf
DOI :
10.1109/ISEMC.2000.875592
Filename :
875592
Link To Document :
بازگشت