Title :
Analysis of RFI effects in voltage regulator ICs: measurement techniques, picking capability prediction and protection methods
Author :
Florean, D. ; Pinelli, M. ; Tomasin, P.
Author_Institution :
Dept. of Electron. & Inf., Padova Univ., Italy
Abstract :
When radio frequency interference (RFI) couples with the pins of an integrated circuit (IC) it can cause an operation variation due to the rectification, that implies a variation of the bias point. In the paper a methodology for the evaluation of the RFI in an analog IC is presented, in an immunity test context. For example RFI is taken into account in the case of voltage regulators 7805 (Vout=5 V) and 7905 (Vout=-5 V). With the use of a 3D FEM field simulator HFSS, by Ansoft, the capability of coupling the RFI by the IC pins is predicted. Some protection methods for reducing the RFI effects are presented, and their efficacy is estimated
Keywords :
analogue integrated circuits; finite element analysis; integrated circuit testing; protection; radiofrequency interference; voltage regulators; 5 V; HFSS 3D FEM field simulator; RFI effects; analog IC; bias point; capability prediction; immunity test context; integrated circuit pins; measurement techniques; protection methods; radio frequency interference; rectification; voltage regulator IC; Analog integrated circuits; Circuit testing; Coupling circuits; Integrated circuit measurements; Integrated circuit testing; Pins; Radiofrequency integrated circuits; Radiofrequency interference; Regulators; Voltage measurement;
Conference_Titel :
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5677-2
DOI :
10.1109/ISEMC.2000.875599
