Analysis of RFI effects in voltage regulator ICs: measurement techniques, picking capability prediction and protection methods

Author

Florean, D. ; Pinelli, M. ; Tomasin, P.

Author_Institution

Dept. of Electron. & Inf., Padova Univ., Italy

Volume

1

fYear

2000

fDate

2000

Firstpage

391

Abstract

When radio frequency interference (RFI) couples with the pins of an integrated circuit (IC) it can cause an operation variation due to the rectification, that implies a variation of the bias point. In the paper a methodology for the evaluation of the RFI in an analog IC is presented, in an immunity test context. For example RFI is taken into account in the case of voltage regulators 7805 (V_out=5 V) and 7905 (V_out=-5 V). With the use of a 3D FEM field simulator HFSS, by Ansoft, the capability of coupling the RFI by the IC pins is predicted. Some protection methods for reducing the RFI effects are presented, and their efficacy is estimated

Keywords

analogue integrated circuits; finite element analysis; integrated circuit testing; protection; radiofrequency interference; voltage regulators; 5 V; HFSS 3D FEM field simulator; RFI effects; analog IC; bias point; capability prediction; immunity test context; integrated circuit pins; measurement techniques; protection methods; radio frequency interference; rectification; voltage regulator IC; Analog integrated circuits; Circuit testing; Coupling circuits; Integrated circuit measurements; Integrated circuit testing; Pins; Radiofrequency integrated circuits; Radiofrequency interference; Regulators; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2000. IEEE International Symposium on

Conference_Location

Washington, DC

Print_ISBN

0-7803-5677-2

Type

conf

DOI

10.1109/ISEMC.2000.875599

Filename

875599