DocumentCode
3578779
Title
Analog IC test and product engineering curriculum for M
Author
Kamsani, N.A. ; Sidek, R.M. ; Yeo, C.W. ; Gan, D. ; Quek, C.T. ; Krishnasamy, S. ; Lee, Y.M. ; Bolanos, M.A.
Author_Institution
Dept. of Electr. & Electron. Eng., Univ. Putra Malaysia, Serdang, Malaysia
fYear
2014
Firstpage
283
Lastpage
287
Abstract
Production test is a significant driver of semiconductor manufacturing cost. Parallel with the advances of semiconductor fabrication, the need for a pool of talented product and test engineers is significantly increasing. This paper describes the academia-industries collaboration effort in developing an analogue electronic test and product engineering to boost-up technical competencies of electronic engineering graduates particularly in microelectronic major. The program has been successfully conducted at Universiti Putra Malaysia with strong support from Texas Instruments and Teradyne.
Keywords
analogue integrated circuits; electronic engineering education; integrated circuit manufacture; integrated circuit testing; production engineering; academia-industries collaboration effort; analog IC test; analogue electronic test; electronic engineering graduates; product engineering curriculum; production test; semiconductor fabrication; semiconductor manufacturing cost; Collaboration; Integrated circuits; Performance evaluation; Software; Testing; Training; Analogue Electronics; Engineering Education; Production Test;
fLanguage
English
Publisher
ieee
Conference_Titel
Teaching, Assessment and Learning (TALE), 2014 International Conference on
Type
conf
DOI
10.1109/TALE.2014.7062641
Filename
7062641
Link To Document