• DocumentCode
    3579001
  • Title

    Analysis of metastability performance in digital circuits on flip-flop

  • Author

    Thakur, Manisha ; Soni, Braj Bihari ; Gaur, Puran ; Yadav, Prashant

  • Author_Institution
    NRI Inst. of Inf. & Sci. Technol., Bhopal, India
  • fYear
    2014
  • Firstpage
    265
  • Lastpage
    269
  • Abstract
    Metastability events are common in digital circuits, and synchronizers are necessary to protect us from their deadly effects. Originally synchronizers were necessary when playing an asynchronous input (that is, one synchronized with the clock input so that could change exactly when the sample). Everything changes can easily be metastable. Switch its data input at the same time that the sampling edge of the clock and you get Metastability. The two signals relative duration of each cycle varies a little, and eventually leading to the metastability, close enough to each other switches. This combination of metastability with normal display devices, occur frequently. Recent semiconducting metal oxide progress (CMOS) additionally leads to unprecedented levels of integration in digital logic systems. Due to the propagation delay of the path and timing clock hold time configuration errors failure occurs in digital circuits. Depending on the application, errors are described by number of deferent terms, including “synchronization failure error” and “Metastability error”. The underlying mechanism for all of these problems is the same, and these terms “Metastability error” is the largest, because it describes the failure of the element in the circuit and not to the application. The reference signal may be either a reference voltage on the base, for example a bias voltage or a reference based on the time, as a clock signal.
  • Keywords
    CMOS logic circuits; clocks; flip-flops; switches; synchronisation; CMOS technology; clock sampling edge; delay path propagation; digital logic circuit; flip-flop; metastability error performance; normal display device; semiconducting metal oxide progress; synchronization failure error; timing clock hold time configuration error; Clocks; Delays; Digital circuits; Flip-flops; Latches; Logic gates; Synchronization; D Flip-flop; Metastability; Microwind;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communication and Network Technologies (ICCNT), 2014 International Conference on
  • Print_ISBN
    978-1-4799-6265-5
  • Type

    conf

  • DOI
    10.1109/CNT.2014.7062767
  • Filename
    7062767