Title :
Dielectric breakdown study in Polyetherimide films under pressure
Author :
Truong Van Hung ; Giam, Hoang The ; Destreul, P. ; Nabila, Zebouchi ; Antoine, Antoniou
Author_Institution :
Lab. de Genie Electr., Univ. Paul Sabatier, Toulouse, France
Abstract :
Breakdown field Fb measurements on Polyetherimide (PEI) films were executed under hydrostatic pressures ranging from 1 to 500 bar. Pressures P were obtained by compression of gaseous nitrogen. Results have shown that Fb, defined by Weibull´s statistic, decreases with P. An explanation of this variation was proposed by using the combination of thermal and electromechanical breakdown theories
Keywords :
Weibull distribution; electric breakdown; high-pressure effects; polymer films; 1 to 500 bar; Weibull statistics; dielectric breakdown; electromechanical breakdown; hydrostatic pressure; polyetherimide film; thermal breakdown; Breakdown voltage; Dielectric breakdown; Dielectric measurements; Electric breakdown; Nitrogen; Ocean temperature; Polymers; Pressure measurement; Sea measurements; Weapons;
Conference_Titel :
Properties and Applications of Dielectric Materials, 2000. Proceedings of the 6th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
0-7803-5459-1
DOI :
10.1109/ICPADM.2000.875714
