• DocumentCode
    357949
  • Title

    Dielectric breakdown study in Polyetherimide films under pressure

  • Author

    Truong Van Hung ; Giam, Hoang The ; Destreul, P. ; Nabila, Zebouchi ; Antoine, Antoniou

  • Author_Institution
    Lab. de Genie Electr., Univ. Paul Sabatier, Toulouse, France
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    399
  • Abstract
    Breakdown field Fb measurements on Polyetherimide (PEI) films were executed under hydrostatic pressures ranging from 1 to 500 bar. Pressures P were obtained by compression of gaseous nitrogen. Results have shown that Fb, defined by Weibull´s statistic, decreases with P. An explanation of this variation was proposed by using the combination of thermal and electromechanical breakdown theories
  • Keywords
    Weibull distribution; electric breakdown; high-pressure effects; polymer films; 1 to 500 bar; Weibull statistics; dielectric breakdown; electromechanical breakdown; hydrostatic pressure; polyetherimide film; thermal breakdown; Breakdown voltage; Dielectric breakdown; Dielectric measurements; Electric breakdown; Nitrogen; Ocean temperature; Polymers; Pressure measurement; Sea measurements; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2000. Proceedings of the 6th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    0-7803-5459-1
  • Type

    conf

  • DOI
    10.1109/ICPADM.2000.875714
  • Filename
    875714
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=357949