Interior Degradation Analysis of Distributed Feedback Laser Using Optical-Beam-Induced Current

Author

Takeshita, Takaharu ; Oda, K. ; Mawatari, H.

Author_Institution

Dept. of Electr. Eng. & Inf. Technol., Kyushu Sangyo Univ., Fukuoka, Japan

Volume

14

Issue

4

fYear

2014

fDate

Dec. 2014

Firstpage

1074

Lastpage

1079

Abstract

We propose a novel optical-beam-induced current (OBIC) measurement technique to detect the degradation of the interior of a laser waveguide. OBIC topographies were obtained with incident transverse-magnetic-mode light, such that OBIC became sensitive to interior degradation. We additionally used transverse-magnetic-mode and transverse-electric-mode lights to confirm that the degradation region of t^0.5 deterioration is mainly located in the active layer, not in the vicinity of the antireflection facet.

Keywords

distributed feedback lasers; laser beams; optical variables measurement; quantum well lasers; waveguide lasers; OBIC; distributed feedback laser; incident transverse-magnetic-mode light; interior degradation analysis; laser waveguide; optical-beam-induced current measurement technique; transverse-electric-mode light; Absorption; Aging; Degradation; Laser modes; Measurement by laser beam; Semiconductor device measurement; Waveguide lasers; Aging; distributed feedback lasers; failure analysis; failure analysis, laser reliability; laser reliability; photon beams; quantum well lasers; semiconductor lasers;

fLanguage

English

Journal_Title

Device and Materials Reliability, IEEE Transactions on

Publisher

ieee

ISSN

1530-4388

Type

jour

DOI

10.1109/TDMR.2014.2369420

Filename

6952921