• DocumentCode
    357955
  • Title

    Electrooptical mapping of nonuniform electric field vector in a dielectric liquid

  • Author

    Ihori, Haruo ; Tanino, Kotaro ; Fujii, Masaharu ; Arii, Kiyomitsu

  • Author_Institution
    Ehime Univ., Matsuyama, Japan
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    427
  • Abstract
    We have investigated nonuniform electric field vector distributions in liquid dielectrics. We have already reported on measurements of symmetrical and nonsymmetrical electric field vector distribution using Kerr electrooptic effect and our unique reconstruction method modified computed tomography technique. The measurement system was composed of a He-Ne laser, a polarizer, a quarter-wave plate, an experimental cell, an analyzer, and a photo-detector. For the measurement of a field vector distribution, it was necessary to measure light intensity twice with changing the optical axis of optical wedges. Moreover, the intensity measurement must be carried out at many points from θ=0 to π around the electrode system. Therefore it took considerable time to measure an electric field distribution. So, we developed a simultaneous three-direction measurement system with three optical systems mixed the two-beam method. Using the new measurement system, the electric field vector distribution was measured in 0.1 minutes
  • Keywords
    Kerr electro-optical effect; dielectric liquids; dielectric measurement; electric field measurement; Kerr effect; computed tomography; dielectric liquid; electro-optical mapping; light intensity measurement; nonuniform electric field vector distribution; optical system; reconstruction algorithm; simultaneous three-direction measurement system; two-beam method; Computed tomography; Dielectric liquids; Dielectric measurements; Electric variables measurement; Electrooptic effects; Lasers and electrooptics; Nonuniform electric fields; Optical polarization; Optical retarders; Reconstruction algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2000. Proceedings of the 6th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    0-7803-5459-1
  • Type

    conf

  • DOI
    10.1109/ICPADM.2000.875721
  • Filename
    875721