• DocumentCode
    3579681
  • Title

    LIN validation frame-work: a novel approach

  • Author

    Sinha, Amit ; Anand, Chetan ; Gupt, Saurabh

  • Author_Institution
    Freescale Semicond., Noida, India
  • fYear
    2014
  • Firstpage
    163
  • Lastpage
    167
  • Abstract
    Automotive semiconductor industry is passing through an era where it is pushing the complex mechanical interconnects to be replaced by the mechatronical system. To simplify the wiring design and to handle the communication process effectively between various systems in automobiles, LIN (Local Interconnect Network) bus protocol has been designed. It is widely used in numerous applications like door locks, mirrors, rain sensors, powertrain, central ECU, etc even at very high temperature.
  • Keywords
    automotive electrics; mechatronics; LIN validation frame-work; automotive semiconductor industry; local interconnect network bus protocol; mechatronical system; Clocks; Protocols; Silicon; Stress; Synchronization; System-on-chip; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Electronics and Safety (ICVES), 2014 IEEE International Conference on
  • Type

    conf

  • DOI
    10.1109/ICVES.2014.7063741
  • Filename
    7063741