• DocumentCode
    3580076
  • Title

    Empirical survival error potential weighted least squares for binary pattern classification

  • Author

    Lei Sun ; Kar-Ann Toh ; Zhiping Lin ; Badong Chen

  • Author_Institution
    Sch. of Inf. & Electron., Beijing Inst. of Technol. Beijing, Beijing, China
  • fYear
    2014
  • Firstpage
    949
  • Lastpage
    952
  • Abstract
    A weighted least squares scheme based on an empirical survival error potential function is proposed in this paper. The empirical survival error potential function provides an error compensation scheme for noise distributions far from being Gaussian. This error compensation procedure is efficiently implemented via a weighted least squares formulation where an analytical solution form is obtained. The performance of the developed scheme is extensively tested on 16 benchmark data sets where the results show promising potential of the proposed empirical survival error distribution compensation scheme for binary pattern classification.
  • Keywords
    least mean squares methods; pattern classification; statistical distributions; binary pattern classification; empirical survival error potential function; error compensation scheme; noise distribution; survival error distribution compensation; weighted least squares scheme; Accuracy; Benchmark testing; Electronic mail; Entropy; Error compensation; Training; Vectors; Binary Classification; Survival Information Potential; Weighted Least Squares;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control Automation Robotics & Vision (ICARCV), 2014 13th International Conference on
  • Type

    conf

  • DOI
    10.1109/ICARCV.2014.7064433
  • Filename
    7064433