Title :
Pose invariant geometrie feature exploring for dense 3D data registration
Author :
Luo, H. ; Shen, J. ; Ng, T.C.
Author_Institution :
Mechatron. Group, Singapore Inst. of Manuf. Technol., Singapore, Singapore
Abstract :
Basic and compound pose invariant geometric features are explored to conduct pre-alignment, down sampling, and outlier removal to improve the speed and accuracy of Iterative Closest Point (ICP) registration on dense 3D laser scanning data for metallic part modeling. Rectification of planar surfaces, which are segmented from point normals and matched on similarity of clustered viewpoint feature histogram (CVFH), achieves good pre-alignment without the need of point correspondence searching across two dense data sets. Salient points after scale-variant difference of normals (DoN) filtering are extracted to significantly down sample the dense data. Squared Euclidian distance between two point feature histograms (DoH) is incorporated into the error function of ICP for outlier removal to further enhance registration accuracy.
Keywords :
computational geometry; feature extraction; image filtering; image registration; image sampling; image segmentation; optical scanners; polishing; robotic welding; CVFH similarity; DoH; DoN filtering; ICP registration accuracy improvement; ICP registration speed improvement; clustered viewpoint feature histogram similarity; data matching; data prealignment; data segmentation; dense 3D data registration; dense 3D laser scanning data; dense data down sampling; error function; feature extraction; iterative closest point registration; metallic part modeling; outlier removal; planar surface rectification; point feature histograms; point normals; pose invariant geometric feature; registration accuracy enhancement; scale-variant difference of normal filtering; squared Euclidian distance; Accuracy; Estimation; Histograms; Iterative closest point algorithm; Robots; Surface fitting; Three-dimensional displays; 3D registration; clustered viewpoint feature histogram; difference of normals; iterative closest point; planar surface rectificaiton; point feature histogram;
Conference_Titel :
Control Automation Robotics & Vision (ICARCV), 2014 13th International Conference on
DOI :
10.1109/ICARCV.2014.7064471