Title :
Attributes reduction model with user preferences
Author :
Xiaodong Yue ; Yufei Chen ; Jin Qian ; Caiming Zhong
Author_Institution :
Sch. of Comput. Eng. & Sci., Shanghai Univ., Shanghai, China
Abstract :
In rough set theory, Attributes Reduction algorithms are utilized to extract patterns or rules from the table-formed decision systems. The attributes reduction algorithms aim to find the minimum subset of attributes which can distinguish all the items of different classes. However, most existing attributes reduction algorithms over-focus the distinguishability of attributes and neglect the user requirements in real applications. To tackle this problem, we propose an attributes reduction model with preferences to discover patterns according to user interests. In the proposed model, user preferences in data mining task are formally represented by attribute orders. For the attributes reduction algorithm implementation, we design the novel data structure of linked list to storage the elements for discerning pairwise items and adopt discernibility thresholds to avoid overfitting. The proposed attributes reduction model with user preferences is performed on UCI data sets. Experimental results demonstrate that the proposed attributes reduction model is effective to extract the data patterns consistent with user requirements.
Keywords :
data mining; data reduction; data structures; rough set theory; storage management; UCI data sets; attribute orders; attributes minimum subset; attributes reduction algorithm; attributes reduction model; data mining task; data patterns; data structure; discernibility thresholds; elements storage; linked list; pairwise items; patterns discovery; rough set theory; user interests; user preferences; user requirements; Algorithm design and analysis; Data mining; Data models; Information systems; Partitioning algorithms; Safety; Solid modeling; Attributes reduction; rough sets; user preference;
Conference_Titel :
Information Technology and Artificial Intelligence Conference (ITAIC), 2014 IEEE 7th Joint International
Print_ISBN :
978-1-4799-4420-0
DOI :
10.1109/ITAIC.2014.7065033