DocumentCode :
358101
Title :
Recent improvements on the specification of transient-fault tolerant VHDL descriptions: a case-study for area overhead analysis
Author :
Vargas, F. ; Amory, A.
Author_Institution :
Dept. of Electr. Eng., Catholic Univ.-PUCRS, Porto Alegre, Brazil
fYear :
2000
fDate :
18-24 Sept. 2000
Firstpage :
249
Lastpage :
254
Abstract :
We present a new approach to design reliable complex circuits with respect to transient faults in memory elements. These circuits are intended to be used in harmful environments like radiation. During the design flow, this methodology is also used to perform an early-estimation of the obtained reliability level. Usually, this reliability estimation step is performed in the laboratory, by means of radiation facilities (particle accelerators). By doing so, the early-estimated reliability level is used to balance the design process into a trade-off between maximum area overhead due to the insertion of redundancy and the minimum reliability required for a given application. This approach is being automated through the development of a CAD tool (FT-PRO). Finally, we present also a case-study of a simple microprocessor used to analyze the FT-PRO performance in terms of the area overhead required to implement the fault-tolerant circuit.
Keywords :
digital integrated circuits; error correction; fault tolerant computing; hardware description languages; high level synthesis; integrated circuit design; integrated circuit reliability; redundancy; transients; CAD tool; FT-PRO tool; SEU; VHDL description specification; area overhead analysis; design methodology; fault-tolerant circuit; harmful environments; memory elements; microprocessor; redundancy; reliability level estimation; reliable complex circuit design; single event upsets; transient-fault tolerant VHDL descriptions; Circuit faults; Design automation; Design methodology; Fault tolerance; Laboratories; Linear particle accelerator; Microprocessors; Performance analysis; Process design; Redundancy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Circuits and Systems Design, 2000. Proceedings. 13th Symposium on
Conference_Location :
Manaus, Brazil
Print_ISBN :
0-7695-0843-X
Type :
conf
DOI :
10.1109/SBCCI.2000.876038
Filename :
876038
Link To Document :
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