• DocumentCode
    358300
  • Title

    Metal vapor deposition on ceramic insulators and vacuum interrupter lifetime prediction

  • Author

    Schellekens, Hans ; Battandie, Jean-Yves

  • Author_Institution
    Schneider lectr., Grenoble, France
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    119
  • Abstract
    A Monte Carlo approach is used to assess the deposition of metal vapour and droplets on the insulating parts of a vacuum interrupter. The model predictions are compared with a SEM analysis of sealed vacuum interrupters after interruption tests at full short circuit currents. The method presented enables electrical lifetime prediction in the design phase of the development
  • Keywords
    Monte Carlo methods; ceramic insulators; circuit-breaking arcs; scanning electron microscopy; short-circuit currents; switchgear testing; vacuum arcs; vacuum interrupters; vapour deposition; Monte Carlo approach; SEM analysis; ceramic insulators; electrical lifetime prediction; interruption tests; metal vapor deposition; sealed vacuum interrupters; short circuit currents; vacuum interrupter lifetime prediction; Cathodes; Ceramics; Chemical vapor deposition; Circuit testing; Contacts; Dielectrics and electrical insulation; Interrupters; Metal-insulator structures; Predictive models; Vacuum arcs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 2000. Proceedings. ISDEIV. XIXth International Symposium on
  • Conference_Location
    Xi´an
  • Print_ISBN
    0-7803-5791-4
  • Type

    conf

  • DOI
    10.1109/DEIV.2000.877270
  • Filename
    877270