DocumentCode
358302
Title
Influence of electric field distribution on charging mechanism on alumina dielectrics by triple junction in vacuum
Author
Yamano, Yasushi ; Ito, Shingo ; Kato, Katsumi ; Hakamata, Yoshimi ; Okubo, Hitoshi
Author_Institution
Nagoya Univ., Japan
Volume
1
fYear
2000
fDate
2000
Firstpage
135
Abstract
Surface flashover characteristics in vacuum is very important for HV insulation design of vacuum interrupter. It should be paid attention to the fact that the insulation characteristics on the dielectric surface are strongly influenced by field emission of electron at a triple junction and the accumulated charges on the dielectric surface. In order to clarify charging mechanism, the authors measured the charging characteristics for various types of triple junction configuration. In particular, they focused on the influence of electric field distribution along solid dielectrics and near the cathode triple junction (CTJ) on the charging characteristics. Through the discussion on experimental results, they confirmed that electric field distribution strongly affected 2-dimensional (2D) distribution of surface charge on dielectric sample. Consequently, it is found that positive charging is generated on Al2O3, when incident angle of electric line of force on the Al2O3 surface becomes larger than 60 degree
Keywords
alumina; cathodes; dielectric materials; electric charge; electric fields; flashover; switchgear testing; vacuum insulation; vacuum interrupters; 2D surface charge distribution; Al2O3; HV insulation design; alumina dielectrics; cathode triple junction; charging characteristics; charging mechanism; electric field distribution; insulation characteristics; positive charging; solid dielectrics; surface flashover characteristics; vacuum interrupter; vacuum triple junction; Cathodes; Dielectric measurements; Dielectrics and electrical insulation; Electrodes; Electron emission; Flashover; Solids; Surface charging; Surface discharges; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Discharges and Electrical Insulation in Vacuum, 2000. Proceedings. ISDEIV. XIXth International Symposium on
Conference_Location
Xi´an
Print_ISBN
0-7803-5791-4
Type
conf
DOI
10.1109/DEIV.2000.877274
Filename
877274
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