Title :
Laser profile measurements of an H- beam
Author :
Connolly, R. ; Cameron, P. ; Cupolo, J. ; Grau, M. ; Kesselman, M. ; Liaw, C.J. ; Sikora, R.
Author_Institution :
Brookhaven Nat. Lab., Upton, NY, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
A non-intercepting beam profile monitor for H- beams is being developed at Brookhaven National Lab. An H- ion has a first ionization potential of 0.75eV. Electrons can be removed from an H - beam by passing light from a near infrared laser through it. Experiments have been performed on the BNL linac to measure the transverse profile of a 750keV beam by using a Nd:YAG laser to photoneutralize narrow slices of the beam. The laser beam is scanned across the ion beam neutralizing the portion of the beam struck by the laser. The electrons are removed from the ion beam and the beam current notch is measured
Keywords :
ion beams; measurement by laser beam; particle beam diagnostics; solid lasers; 750 keV; H; H- beam; Nd:YAG laser; YAG:Nd; YAl5O12:Nd; beam current notch; beam profile monitor; near IR laser; transverse profile; Electron beams; Free electron lasers; Ion beams; Laser beams; Linear particle accelerator; Mirrors; Particle beams; Pulse transformers; Storage rings; Structural beams;
Conference_Titel :
Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
Print_ISBN :
0-7803-7191-7
DOI :
10.1109/PAC.2001.986660
