DocumentCode
3584713
Title
A low-cost experimental test bench for electronic power devices
Author
Mtimet, Sameh ; Kourda, Ferid ; Ben Salah, Tarek
Author_Institution
ENIT, Univ. of Tunis El Manar, Tunis, Tunisia
fYear
2014
Firstpage
1
Lastpage
6
Abstract
A low-cost experimental test bench is proposed to test electronic power devices such as Diode, MOSFET, and JFET. This bench is based on the dc-dc converter. This latter controls the applied voltage and current. The proposed experimental bench consists to test devices in various types of dc-dc converter according to the current and voltage levels required. Experimental measurements of the new silicon carbide JFET device, for example, are presented and discussed.
Keywords
DC-DC power convertors; power semiconductor devices; semiconductor device testing; test equipment; DC-DC power converter; JFET; MOSFET; SiC JFET device; diode; electronic power devices; low-cost test bench; Capacitance; Current measurement; DC-DC power converters; Probes; Switches; Switching circuits; Transistors; SiC-JFET; dc-dc converter; experimental; test bench;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Sciences and Technologies in Maghreb (CISTEM), 2014 International Conference on
Type
conf
DOI
10.1109/CISTEM.2014.7076929
Filename
7076929
Link To Document