Title :
FPN correction for a linear-logarithmic CMOS image sensor with a tunable linear range using two-step charge transfer
Author :
Byeungseok Yoo ; Inkyu Baek ; Kyounghoon Yang
Author_Institution :
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
Abstract :
This paper presents a fixed pattern noise (FPN) correction method for a linear-logarithmic CMOS image sensor (CIS) with a tunable linear response range. The proposed method is based on a two-step charge transfer operation to calibrate the offset FPN caused by the threshold voltage variation of the transfer gate under various linear ranges. The prototype image sensor consisting of a 320 × 240 pixel array with a 2.25 μm pixel pitch is fabricated with a 0.13 μm CIS process. It is found that the offset FPN is reduced by 90 % while the linear range is tuned by 20 % of the full output range.
Keywords :
CMOS image sensors; calibration; measurement errors; CIS process; FPN correction; fixed pattern noise correction method; linear-logarithmic CMOS image sensor; offset FPN calibration; size 0.13 mum; threshold voltage variation; tunable linear range; two-step charge transfer; Biomedical imaging; CMOS integrated circuits; Lighting; System-on-chip; CMOS image sensor; fixed pattern noise; tunable linear-logarithmic response; wide dynamic range;
Conference_Titel :
SoC Design Conference (ISOCC), 2014 International
DOI :
10.1109/ISOCC.2014.7087579
