• DocumentCode
    358748
  • Title

    A novel approach for realizing hard-driven gate-turn-off thyristor

  • Author

    Li, Yuxin ; Motto, Kevin ; Huang, Alex Q.

  • Author_Institution
    Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    87
  • Abstract
    This paper proposes a new configuration to help a GTO to achieve unity turn-off gain and snubberless turn-off capability by utilizing a series connected discrete diode. The maximum turn-off gate voltage, which is crucial for realizing a high commutation di/dt in the GTO gate loop, can be increased from about 20 V of a GTO´s gate-cathode breakdown to a voltage higher than the breakdown voltage of the added diode. The crucial issues that affect the snubberless turn-off capability of the new device are identified and analyzed. Experimental results including snubberless turn-off are also presented
  • Keywords
    commutation; power semiconductor diodes; power semiconductor switches; semiconductor device measurement; semiconductor device models; semiconductor device testing; switching; thyristors; GTO gate loop; commutation di/dt; configuration; diode breakdown voltage; gate-cathode breakdown; hard-driven gate-turn-off thyristor; maximum turn-off gate voltage; realisation approach; series connected discrete diode; snubberless turn-off capability; unity turn-off gain; Breakdown voltage; Diodes; Frequency; Inductance; MOSFETs; Power electronics; Snubbers; Switches; Thyristors; Turning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 2000. PESC 00. 2000 IEEE 31st Annual
  • Conference_Location
    Galway
  • ISSN
    0275-9306
  • Print_ISBN
    0-7803-5692-6
  • Type

    conf

  • DOI
    10.1109/PESC.2000.878810
  • Filename
    878810