Title :
Investigation of the effect of gate voltage on the performance of organic bulk hetero-junction based phototransistor
Author :
Yasin, Muhammad ; Tauqeer, T. ; San, Sait Eren ; Kosemen, Zuhal A. ; Karimov, Kh.S. ; Mahmood, Asad
Author_Institution :
Nat. Univ. of Sci. & Technol., Islamabad, Pakistan
Abstract :
In this work, we have investigated the effect of gate voltage on the performance of poly(3-hexylthiophene) (P3HT) and [6,6]-phenyl C61-butyric acid methylester (PCBM) bulk hetero-junction based organic phototransistor. Transistor was fabricated in MESFET configuration with top gate and bottom drain-source electrodes on glass substrate. Active layer showed Schottky type contact with Gate electrode and Ohmic contact with Drain-Source electrodes. Current-Voltage (I-V) characteristics of the device were studied under dark and UV-Vis illumination. Active layer of the device has shown p-type and ambipolar properties under dark and UV-Vis illumination, respectively. Drain to source current of the phototransistor was found dependent on the illumination intensity and gate to source voltage. Photo sensitivity and responsivity values of the device were found to decrease exponentially with the increase of gate voltage. Photo sensitivity and responsivity values of the device were found equal to 11 and 0.024 A/W, respectively, at 90mW/cm2 UV-Vis illumination intensity and 0 gate voltage.
Keywords :
Schottky barriers; Schottky gate field effect transistors; electrodes; ohmic contacts; organic semiconductors; phototransistors; MESFET; P3HT; PCBM; Schottky type contact; UV-Vis illumination; [6 6]-phenyl C61-butyric acid methylester; ambipolar properties; bottom drain-source electrodes; dark illumination; gate voltage effect; glass substrate; illumination intensity; ohmic contact; organic bulk heterojunction based phototransistor; organic phototransistor; p-type properties; photosensitivity; poly(3-hexylthiophene); top gate electrodes; Electrodes; Lighting; Logic gates; MESFETs; MOSFET; Metals; Nanoscale devices;
Conference_Titel :
Multi-Topic Conference (INMIC), 2014 IEEE 17th International
Print_ISBN :
978-1-4799-5754-5
DOI :
10.1109/INMIC.2014.7097381