Title :
Data acquisition and control system for broad-band microwave reflectometry on EAST
Author :
Fei Wen ; Tao Zhang ; Shoubiao Zhang ; Defeng Kong ; Yuming Wang ; Xiang Han ; Hao Qu ; Xiang Gao
Author_Institution :
Inst. of Plasma Phys., Hefei, China
Abstract :
Microwave reflectometry is a non-intrusive plasma diagnostic tool which is widely applied in many fusion devices. In 2014, the microwave reflectometry on Experimental Advanced Superconducting Tokamak (EAST) had been upgraded to measure plasma density profile and fluctuation, which covered the frequency range of Q-band (32-56 GHz), V-band (47-76 GHz) and W-band (71-110 GHz). This paper presented a dedicated data acquisition and control system (DAQC) to meet the measurement requirements of high accuracy and temporal resolution. The DAQC consisted of two control modules, which integrated arbitrary waveform generation block (AWG) and trigger processing block (TP), and two data acquisition modules (DAQ) that was implemented base on the PXIe platform from National Instruments (NI). All the performance parameters had satisfied the requirements of reflectometry. The actual performance will be further examined in the experiments of EAST in 2014.
Keywords :
Tokamak devices; data acquisition; microwave reflectometry; millimetre wave measurement; plasma density; plasma diagnostics; superconducting devices; AWG; DAQC; EAST; Experimental Advanced Superconducting Tokamak; NI; National Instruments; PXIe platform; TP; broadband microwave reflectometry; data acquisition and control system; frequency 32 GHz to 56 GHz; frequency 47 GHz to 76 GHz; frequency 71 GHz to 110 GHz; fusion device; integrated arbitrary waveform generation block; nonintrusive plasma diagnostic tool; plasma density profile measurement; trigger processing block; Data acquisition; Fluctuations; Materials requirements planning; Microwave measurement; Reflectometry; Superconducting microwave devices; Voltage-controlled oscillators;
Conference_Titel :
Real Time Conference (RT), 2014 19th IEEE-NPSS
Print_ISBN :
978-1-4799-3658-8
DOI :
10.1109/RTC.2014.7097504