Title :
Stochastic LIM for transient simulation of circuits with uncertainties
Author :
Xu Chen ; Qiu, Michael ; Schutt-Aine, Jose E. ; Cangellaris, Andreas C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
This paper presents a stochastic Latency Insertion Method formulation using the generalized Polynomial Chaos framework. The proposed method enables fast simulation of circuits with uncertain elements. When the mean and variance of circuit elements are provided in the netlist, this method can calculate the statistics of the transient response to arbitrary sources using an augmented state space system. Due to the underlying leapfrogging finite difference scheme, the computational complexity grows only linearly with the number of terms in the expansion. The formulation is verified using Monte Carlo on a random resistor network with inserted latencies.
Keywords :
Monte Carlo methods; chaos; computational complexity; finite difference methods; polynomial approximation; resistors; transient response; Monte Carlo; augmented state space system; circuit elements; circuits uncertainty; computational complexity; generalized polynomial chaos framework; leapfrogging finite difference scheme; random resistor network; stochastic LIM; stochastic latency insertion method; transient response; transient simulation; Computational modeling; Integrated circuit modeling;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2014 IEEE 23rd Conference on
Print_ISBN :
978-1-4799-3641-0
DOI :
10.1109/EPEPS.2014.7103585
