Title :
Statistical modeling of metastability in ADC-based serial I/O receivers
Author :
Shengchang Cai ; Shafik, Ayman ; Kiran, Shiva ; Zhian Tabasy, Ehsan ; Hoyos, Sebastian ; Palermo, Samuel
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
This paper develops metastability error models for flash and asynchronous SAR ADCs and describes a novel ADC-based receiver statistical modeling methodology to analyze the BER performance impact of metastability error propagation through digital FFE equalization.
Keywords :
analogue-digital conversion; asynchronous circuits; equalisers; error statistics; feedforward; integrated circuit modelling; receivers; statistical analysis; ADC-based serial I-O receivers; BER; asynchronous SAR ADC; bit error rate; digital FFE equalization; digital feed forward equalizer; flash SAR ADC; metastability error models; metastability error propagation; statistical modeling methodology; Analytical models; Backplanes; Bit error rate; Decision support systems; Integrated circuit modeling; Latches; Receivers; ADC-based receiver; metastability; statistical BER;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2014 IEEE 23rd Conference on
Print_ISBN :
978-1-4799-3641-0
DOI :
10.1109/EPEPS.2014.7103588
