DocumentCode
3588995
Title
IO power delivery network impedance measurement at chip level
Author
Fei Guo ; Catherine, Solis
Author_Institution
Adv. Micro Devices, Markham, ON, Canada
fYear
2014
Firstpage
109
Lastpage
112
Abstract
This paper describes a technique for characterizing Input/Output (IO) power delivery networks using Vector Network Analyzer (VNA) S21 measurements, which is expanded from the core Power Delivery Networks (PDN) measurement technique we developed. The technique uses the two-port, self-impedance measurement concept for low impedance PDN measurement. It is validated mathematically through network analysis and makes use of an auxiliary test fixture to remove the effect of the channel between measurement points and bumps. Measurements of a sample are presented to show the effectiveness of the methodology.
Keywords
electric impedance measurement; microprocessor chips; network analysers; network analysis; IO power delivery network; VNA measurements; auxiliary test fixture; chip level; input-output power delivery networks; network analysis; self-impedance measurement; vector network analyzer; Current measurement; Impedance; Impedance measurement; Ports (Computers); Semiconductor device measurement; Switches; System-on-chip; Vector Network Analyzer; power delivery network impedance measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2014 IEEE 23rd Conference on
Print_ISBN
978-1-4799-3641-0
Type
conf
DOI
10.1109/EPEPS.2014.7103608
Filename
7103608
Link To Document