Title :
Jitter correlation induced by channel dispersion
Author :
Fangyi Rao ; Warwick, Colin
Author_Institution :
Agilent Technol., Inc., Santa Clara, CA, USA
Abstract :
Correlation between inter-symbol-interference (ISI), duty-cycle-distortion (DCD) and random jitter (RJ) at data channel output is investigated. Jitter components are extracted by comparing crossing time data between repeated simulations under different input jitter conditions. The results show that due to channel dispersion, DCD and RJ RMS at a given output edge depend on the pattern of neighboring bits and vary between edges, leading to correlations between output DCD, RJ and ISI.
Keywords :
data communication; intersymbol interference; jitter; ISI; channel dispersion; data channel output; duty-cycle-distortion; inter-symbol-interference; jitter components; jitter conditions; jitter correlation; random jitter; time data; Clocks; Computational modeling; Correlation; Dispersion; Frequency modulation; Indexes; Jitter; correlation; dispersion; jitter;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2014 IEEE 23rd Conference on
Print_ISBN :
978-1-4799-3641-0
DOI :
10.1109/EPEPS.2014.7103626
