Title :
Accuracy tolerance analysis of the multimode TRL de-embedding technique
Author :
Gen Yin ; Xiao-Ding Cai ; Secker, David ; Ortiz, Matt ; Cline, Julia ; Vaidyanath, Arun
Author_Institution :
Dept. of Electr. Eng., Univ. of California, Riverside, Riverside, CA, USA
Abstract :
A perturbation analysis is carried out in the multimode TRL (through-reflection-line) de-embedding formulae to evaluate the accuracy tolerance. The trends obtained by this analysis is confirmed by the corresponding experimental verifications.
Keywords :
network analysers; network analysis; perturbation techniques; tolerance analysis; accuracy tolerance analysis; multimode TRL deembedding formulae; multimode TRL deembedding technique; perturbation analysis; through-reflection-line; Calibration; Impedance; Power transmission lines; Scattering parameters; Standards; Transmission line matrix methods; Transmission line measurements; Multimode TRL; accuracy tolerance; de-embedding;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2014 IEEE 23rd Conference on
Print_ISBN :
978-1-4799-3641-0
DOI :
10.1109/EPEPS.2014.7103634
