Title :
Non-intrusive pseudo spectral approach for stochastic macromodeling of EM systems using deterministic full-wave solvers
Author :
Kabir, Muhammad ; Khazaka, Roni ; Talukder, Md A. H. ; Ahadi, Majid ; Chobanyan, Elene ; Smull, Aaron ; Roy, Sourajeet ; Notaros, Branislav M.
Author_Institution :
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada
Abstract :
In this paper, a novel stochastic macromodeling technique for the variability analysis of complex electromagnetic (EM) structures is proposed. This work combines a pseudo spectral approach with the Loewner matrix interpolation technique to generate the polynomial chaos macromodel from the stochastic S-parameters of the structure. The major benefit of the proposed strategy is that by exploiting the non-intrusive nature of the pseudo spectral approach, the stochastic macromodel can be generated directly from a small number of deterministic EM full-wave simulations. This enables the utilization of the robustness and versatility of conventional deterministic full-wave techniques without the need for the cumbersome stochastic Galerkin formulation.
Keywords :
Galerkin method; S-parameters; VLSI; chaos; electromagnetic waves; integrated circuit modelling; interpolation; polynomials; stochastic processes; EM structures; EM systems; Loewner matrix interpolation technique; deterministic EM full-wave simulations; deterministic full-wave solvers; deterministic full-wave techniques; electromagnetic structures; nonintrusive pseudospectral approach; polynomial chaos macromodel; stochastic Galerkin formulation; stochastic S-parameters; stochastic macromodeling technique; variability analysis; Chaos; Computational modeling; Microstrip; Polynomials; Random variables; Scattering parameters; Transmission line matrix methods; Distributed networks; Loewner matrix; S-parameters; full-wave solution; macromodeling; stochastic analysis;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2014 IEEE 23rd Conference on
Print_ISBN :
978-1-4799-3641-0
DOI :
10.1109/EPEPS.2014.7103642