Title :
Fast assessment method of major defects for LED luminaires
Author :
Huawei Xu ; Shen Wang
Author_Institution :
Fifth Res. Inst., Quality Inspection & Testing Center, MIIT, Guangzhou, China
Abstract :
This paper introduces the failure modes and mechanism analysis of Light-emitting diode (LED) luminaires in the process of actual application, based on this, combined with the lifetime load information of LED luminaires, the sensitive stress of the main failure modes were carried out by the reliability analysis methods. By introduction of the notion of "major defects", we analyzed the failure modes of LED luminaires and study the fast assessment method of major defects assessment technology. The comparison analysis among the failure modes in actual working condition and obtained from the fast assessment method of major defects experiment, it is showed that the results are consistent. We analyzed the LED luminaires under experiment which does not fail at the end of the experiment, the results show that the lifetime of these samples can achieve at least 7000 hours which the reliability of lifetime is over 95%. The test results prove that the fast assessment method of major defects is an effective accelerated test method for evaluating LED luminaires reliability in short time.
Keywords :
failure analysis; light emitting diodes; light sources; reliability; LED luminaire failure analysis; LED luminaire reliability analysis; lifetime load information; major defects fast assessment method; sensitive stress; Employee welfare; Light emitting diodes; Lighting; Maintenance engineering; Reliability; Temperature sensors; Testing; LED luminaires; failure modes; fast assessment method; major defects; reliability;
Conference_Titel :
Reliability, Maintainability and Safety (ICRMS), 2014 International Conference on
Print_ISBN :
978-1-4799-6631-8
DOI :
10.1109/ICRMS.2014.7107125