DocumentCode :
3589755
Title :
Grinding decapsulation method application in failure analysis of plastic encapsulated devices
Author :
Liyuan Liu ; Guanghua Yuan ; Xuanlong Chen
Author_Institution :
Fifth Res. Inst., MIIT, Guangzhou, China
fYear :
2014
Firstpage :
77
Lastpage :
81
Abstract :
Grinding as one of the most important mechanical decapsulation methods is always used in plastic encapsulated devices failure analysis (FA). It has advantages in protecting failure site as compared to traditional chemical decapsulation methods, especially for some failure mechanisms such as silver electrochemical migration, metal corrosion, ionic contaminant, solder balls bridging, poor bonding, etc. In this paper, the key steps and some notes of grinding decapsulation methods(GDM) are presented, as well as cases of three failure mechanisms using grinding method are introduced in detail for revealing its necessity. Meanwhile the application area is discussed. The fundament for further choice of decapsulation was established.
Keywords :
encapsulation; failure analysis; grinding; plastic packaging; FA; GDM; failure analysis; failure mechanism; failure site protection; grinding decapsulation method application; ionic contaminant; metal corrosion; plastic encapsulated device; poor bonding; silver electrochemical migration; solder balls bridging; Bonding; Corrosion; Failure analysis; Plastics; Silver; Transistors; cases; failure analysis; grinding decapsulation method; plastic encapsulated devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability, Maintainability and Safety (ICRMS), 2014 International Conference on
Print_ISBN :
978-1-4799-6631-8
Type :
conf
DOI :
10.1109/ICRMS.2014.7107141
Filename :
7107141
Link To Document :
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