Title :
Reliability evaluation on 3–5μm solid state lasers
Author :
Guoguang Lu ; Mingming Hao ; Shaofeng Xie ; Yun Huang
Author_Institution :
Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., Guangzhou, China
Abstract :
Thermal effects in solid-state laser materials are a critical issue for designing diode-pumped solid-state lasers, the temperature distribution with different pump beam transverse profiles by using finite element method on 3-5μm solid-state laser are give in this paper. Based on the theoretical analysis, the thermal focal length of Tm: YAP crystal "b" direction and "c" direction are also given in this paper. Otherwise, the aging test for 3-5μm solid-state laser is developed, and the aging test results show that the lifetime of 3-5μm solid-state laser is reach to 134 hours.
Keywords :
finite element analysis; semiconductor lasers; thulium; YAP:Tm; crystal; diode-pumped solid-state lasers; finite element method; pump beam transverse; solid-state laser materials; temperature distribution; thermal effects; time 134 hour; wavelength 3 mum to 5 mum; Crystals; Laser excitation; Power lasers; Pump lasers; Surface emitting lasers; Temperature distribution; aging; reliability; solid-state laser; thermal effects;
Conference_Titel :
Reliability, Maintainability and Safety (ICRMS), 2014 International Conference on
Print_ISBN :
978-1-4799-6631-8
DOI :
10.1109/ICRMS.2014.7107160
