Accelerated test and life prediction of integrated Dewar for infrared detector

The integrated micro metal Dewar is an essential assembly in the infrared detector, and it is required more than ten years vacuum lifetime during application. In this paper, the critical effect factors and failure mechanisms on the vacuum lifetime were analyzed. Four groups of high temperature accelerated life test were introduced, according to the vacuum degradation mechanism, the end-of-life of samples that under failure criterion were fitted and extrapolated. Based on Weibull distribution, the characteristic lifetime of each group samples and activation energy were calculated. Finally, the dewar lifetime extrapolation to room temperature of work condition was predicted more than 12 years.