• DocumentCode
    3590452
  • Title

    Hopf bifurcation in the Hodgkin-Huxley model exposed to ELF electrical field

  • Author

    Wang, J. ; Zhang, H. ; Tsang, K.M.

  • Author_Institution
    Dept. of Electr. & Autom. Eng., Tianjin Univ., China
  • Volume
    3
  • fYear
    2003
  • Firstpage
    2323
  • Abstract
    This paper discussed the interference between external electric exposure and biological objects. Based on results of space-time characteristics of trans-membrane voltage, the variation of cell trans-membrane voltage exposed to extremely low frequency (ELF) electrical field was analyzed; the traditional Hodgkin-Huxley model was modified by importing new parameter denoting external electrical fields, and the bifurcation caused by new parameter war found. This paper employed the algebra criterion in high dimension equations to perform the analysis of single parameter dynamical bifurcation. The results were biological significant and suggested that the aberration of dynamics in bio-systems may be accounted for diseases caused by electric exposure.
  • Keywords
    bifurcation; bioelectric phenomena; biological effects of fields; biomembranes; muscle; physiological models; ELF electrical field; Hodgkin-Huxley model; Hopf bifurcation; extremely low frequency electrical field; trans-membrane voltage; Algebra; Bifurcation; Biological system modeling; Equations; Frequency; Geophysical measurement techniques; Ground penetrating radar; Interference; Performance analysis; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2003. Proceedings of the 25th Annual International Conference of the IEEE
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-7789-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.2003.1280381
  • Filename
    1280381