DocumentCode
3590452
Title
Hopf bifurcation in the Hodgkin-Huxley model exposed to ELF electrical field
Author
Wang, J. ; Zhang, H. ; Tsang, K.M.
Author_Institution
Dept. of Electr. & Autom. Eng., Tianjin Univ., China
Volume
3
fYear
2003
Firstpage
2323
Abstract
This paper discussed the interference between external electric exposure and biological objects. Based on results of space-time characteristics of trans-membrane voltage, the variation of cell trans-membrane voltage exposed to extremely low frequency (ELF) electrical field was analyzed; the traditional Hodgkin-Huxley model was modified by importing new parameter denoting external electrical fields, and the bifurcation caused by new parameter war found. This paper employed the algebra criterion in high dimension equations to perform the analysis of single parameter dynamical bifurcation. The results were biological significant and suggested that the aberration of dynamics in bio-systems may be accounted for diseases caused by electric exposure.
Keywords
bifurcation; bioelectric phenomena; biological effects of fields; biomembranes; muscle; physiological models; ELF electrical field; Hodgkin-Huxley model; Hopf bifurcation; extremely low frequency electrical field; trans-membrane voltage; Algebra; Bifurcation; Biological system modeling; Equations; Frequency; Geophysical measurement techniques; Ground penetrating radar; Interference; Performance analysis; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2003. Proceedings of the 25th Annual International Conference of the IEEE
ISSN
1094-687X
Print_ISBN
0-7803-7789-3
Type
conf
DOI
10.1109/IEMBS.2003.1280381
Filename
1280381
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