Analysis of line current wave diffraction from metal-backed dielectric strip by extended PO method

Author

Andrenko, Andrey S. ; Ando, Makoto

Author_Institution

Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol., Japan

Volume

1

fYear

1998

fDate

6/20/1905 12:00:00 AM

Firstpage

387

Abstract

We present the modified physical optics (PO) analysis of line current wave scattering by planar metal-backed dielectric strips. The effects of dielectric coatings on the reflecting properties of planar strips are analyzed in the detail including the differences of pattern shape and null points´ shift in the cases of E- and H-polarized scattering. It is shown that changing the dielectric permittivity and thickness of a coating may result in substantial pattern shape transformation for the same width of a reflector aperture. The robustness of proposed approach can also be used for studying the scattering properties of thin multilayered and varying thickness coatings by applying the corresponding expressions for the reflection coefficient

Keywords

electromagnetic wave diffraction; physical optics; physical theory of diffraction; line current wave diffraction; metal backed dielectric strip; physical optics; planar reflector; Apertures; Coatings; Dielectrics; Optical diffraction; Optical scattering; Pattern analysis; Permittivity; Physical optics; Shape; Strips;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics and Engineering of Millimeter and Submillimeter Waves, 1998. MSMW '98. Third International Kharkov Symposium

Print_ISBN

0-7803-5553-9

Type

conf

DOI

10.1109/MSMW.1998.759017

Filename

759017