Title :
Research on Development Character of Middle and Small Size Fault Structure in DongPang Mine Field on Fractal Theory
Author :
Xue-yang, Sun ; Yu-Cheng, Xia
Author_Institution :
Sch. of Geol. & Environ., Xi´´an Univ. of Sci. & Technol., Xi´´an, China
Abstract :
Middle and small size fault structure is the key geological factor affecting the safety production of DongPang mine field. Finding out development character of middle and small fault structure in DongPang mine field is to provide the geological premise for mining design of coal mine and working face layout. Based on the analysis of real data, 20 factors affecting the development of middle and small fault structure are summarized. And on the fractal theory, the fault fractal dimension value is worked out ;and then the key factors affecting the development of middle and small fault structure are filtrated by means of regression analysis, finally the relation of fault fractal dimension and the key factors affecting fault structure development is analyzed by using the grey relational analysis method. The results showed that fault fractal dimension can be used as comprehensive index of quantity, scale, combination form, horizontal extending length and in homogeneity of distribution of fault structure. And the bigger its value is, the more fault structure is developed. Hence, fault fractal dimension is a reliable index denoting development degree of middle and small fault structure in DongPang mine field.
Keywords :
coal; fractals; grey systems; mining industry; production management; regression analysis; safety; DongPang mine field; fault fractal dimension value; fault structure development; fractal theory; geological factor; index denoting development degree; mining design; regression analysis; safety production; Difference equations; Fractals; Geologic measurements; Geology; Industrial engineering; Production; Quantization; Shape measurement; Size control; Thickness measurement; DongPang mine field of China; fault fractal dimension; fractal theory; middle and small size fault structure;
Conference_Titel :
Computing, Control and Industrial Engineering (CCIE), 2010 International Conference on
Print_ISBN :
978-0-7695-4026-9
DOI :
10.1109/CCIE.2010.51