Title :
Layout optimization by pattern modification
Author_Institution :
Cadence Design Syst. Inc., San Jose, CA, USA
Abstract :
A new and practical approach to several layout optimization problems is introduced. A novel two-dimensional pattern generator, in connection with a set of routing and placement transformations, is employed to efficiently solve problems ranging from wire crossing minimization and topological via minimization to minimum Steiner tree optimization and IO alignment. The expected running time is O( n log n) and the space requirement is O(n ), where n is the number of layout objects. The system was fully coded and tested, and excellent results in both laboratory and real-life examples were achieved
Keywords :
circuit layout CAD; computational complexity; minimisation; IO alignment; layout optimization problems; minimum Steiner tree optimization; pattern modification; placement transformations; routing; running time; space requirement; topological via minimization; two-dimensional pattern generator; wire crossing minimization; Cost function; Design optimization; Explosions; Laboratories; Optimization methods; Rivers; Routing; System testing; Topology; Wire;
Conference_Titel :
Design Automation Conference, 1990. Proceedings., 27th ACM/IEEE
Print_ISBN :
0-89791-363-9
DOI :
10.1109/DAC.1990.114930