Time interval measurement with application to electronic/optoelectronic circuits and systems

In this paper measurement techniques which can be used for measurement of the nanosecond time intervals in various applications are discussed. We present our time interval measurement set up based on the start-step principle using a time-to-amplitude converter. The results of evaluating the timing characteristics in some electronic and optoelectronic circuits and systems, with picosecond resolution and statistical analysis of the experimental data, are reported.