DocumentCode :
3592535
Title :
Planning large systems reliability growth tests
Author :
Smith, Darold K.
Author_Institution :
Motorola, Inc., Scottsdale
fYear :
1984
fDate :
6/6/1905 12:00:00 AM
Firstpage :
471
Lastpage :
475
Keywords :
Computer displays; Contracts; Degradation; Distributed computing; Power supplies; Power system planning; Power system reliability; Redundancy; System testing; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1984. Proceedings. Annual
Type :
conf
DOI :
10.1109/RAMS.1984.764337
Filename :
764337
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3592535
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