Title :
Direct measurement of transverse mode correlation and MPN using 900nm VCSELs
Author :
Lavrencik, Justin ; Pavan, Sriharsha Kota ; Haupt, David K. ; Ralph, Stephen E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Cross-correlations between VCSEL transverse modes are measured using 40GSps synchronous observations of spatially separated modes. Positive correlation and anti-correlation behaviors are observed as well as low, distinct kmpn, contrary to assumptions of the IEEE model.
Keywords :
laser cavity resonators; laser modes; laser noise; laser variables measurement; surface emitting lasers; IEEE model; VCSEL transverse modes; anti-correlation behaviors; cross-correlations; direct measurement; mode partition noise; positive correlation; spatially separated modes; synchronous observations; transverse mode correlation; wavelength 900 nm; Computers; Optical fibers;
Conference_Titel :
Optical Fiber Communications Conference and Exhibition (OFC), 2015
