Title :
Ultra high reliability, ultra high power 1480 nm pump laser diodes
Author :
Crump, P.A. ; Ring, W.S. ; Ash, R.M. ; Hawridge, A. ; Athroll, I. ; Taylor, A. ; Brown, E. ; Hansler, A.
Author_Institution :
Ipswich Components Oper., Hewlett Packard Ltd., Ipswich, UK
Abstract :
High-performance extremely reliable 1480-nm pump laser diodes have been developed. High facet powers for low drive currents (220 mW at 500 mA), narrow far field (22/spl times/17/spl deg/) and long median life (>1/spl times/10/sup 8/ hours) are demonstrated.
Keywords :
laser reliability; laser transitions; life testing; optical pumping; optical testing; optical transmitters; semiconductor device testing; semiconductor lasers; wavelength division multiplexing; 1480 nm; 220 mW; 25 y; 500 mA; 980 nm; WDM optical transmitter laser diodes; high facet powers; life testing; long median life; low drive currents; narrow far field; nm pump laser diodes; ultra high power; ultra high reliability; Ash; Capacitive sensors; Diode lasers; Fiber lasers; Laser excitation; Laser modes; Power system reliability; Quantum well devices; Stability; Wavelength division multiplexing;
Conference_Titel :
Optical Fiber Communication Conference, 1999, and the International Conference on Integrated Optics and Optical Fiber Communication. OFC/IOOC '99. Technical Digest
Print_ISBN :
1-55752-582-X
DOI :
10.1109/OFC.1999.767781
