Title :
Embedded MEMS modules for BiCMOS process
Author :
Kaynak, M. ; Ehwald, K.E. ; Drews, J. ; Scholz, R. ; Kornd?¶rfer, F. ; Wipf, C. ; Knoll, D. ; Barth, R. ; Birkholz, M. ; Schulz, K. ; Wolansky, D. ; Tillack, B.
Author_Institution :
IHP, Frankfurt (Oder), Germany
Abstract :
Different MEMS process techniques have been integrated to 0.25 μm BiCMOS process. First developed technique is Back-End-Off-Line (BEOL) integration. This technique was developed using standard metallization layers of BiCMOS process with an additional MEMS process steps. An RFMEMS capacitive switch was realized using BEOL embedded MEMS module. Back-side substrate etch method was developed as second MEMS integration technique. This technique is demonstrated by several high-Q passive components which can prevent from substrate losses. Additional MEMS modules were achieved by only adding few more lithography and etch steps. Fully embedded integration of these MEMS process techniques to a standard BiCMOS process will allow realizing single-chip mm-wave transceivers using cost-effective standard SiGe process and allows designer to operate higher frequencies with less losses.
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; lithography; microswitches; millimetre wave devices; BEOL integration; BiCMOS process; MEMS integration; MEMS process; RFMEMS capacitive switch; SiGe; back-end-off-line integration; back-side substrate etch method; embedded MEMS module; high-Q passive component; lithography; single-chip mm-wave transceiver; size 0.25 mum; standard metallization layer; substrate loss; BiCMOS integrated circuits; Etching; Germanium silicon alloys; Lithography; Metallization; Micromechanical devices; Silicon germanium; Standards development; Switches; Transceivers; Embedded MEMS; MEMS-IC Integration; RF-MEMS switch; deep-silicon etch; monolithic integration;
Conference_Titel :
Microwave Conference, 2010 German
Print_ISBN :
978-1-4244-4933-0
Electronic_ISBN :
978-3-9812668-1-8