Gasket pressure probe device: a novel way to measure the volume resistivity of EMI/EMC gaskets

The use of EMI/EMC gaskets to maintain electromagnetic shielding integrity in metallic enclosure, in electronic packaging, is inevitable. One of the basic parameters to be specified of these EMI/EMC and RF gaskets is volume resistivity. To measure the volume resistivity of various types of EMI/EMC gaskets and conducting materials in a rapid and efficient manner as per the standards, a gasket pressure probe device has been developed. The paper discusses the design, development and application of the gasket pressure probe device to measure the volume resistivity of EMI/EMC gasket as per MIL-G-83528, ASTM D 991 and JSS 652100 standards. This device relates broadly to the mechanical engineering field and specifically under the microfield of EMI/EMC-measuring technology. The salient features of the device, include $the ability to measure volume resistivity of different spots, of a continuous strip of gasket; interchangeable test blocks - for different system of units; a calibrated pressure pad assembly; zero adjustment facility; ergonomically designed for easy operation; concealed electrical wiring - for measuring probes; surface treatment for environmental protection and aesthetic appearance; portable - being lightweight in construction.