DocumentCode :
359393
Title :
Analysis of upsets and failures due to ESD by the FDTD-INBCs method
Author :
Maradei, F. ; Raugi, M.
Author_Institution :
Dipartimento di Ingegneria Elettronica, Rome Univ., Italy
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
623
Abstract :
In this paper a finite-difference time domain (FDTD) model of an electrostatic discharge (ESD) event is developed. Analytical expressions for the field radiated during the ESD discharge phase have been determined to test the FDTD model of the strike arc. In order to take into account the electromagnetic field penetration through shielding structures, the conductive panels are efficiently modeled in the FDTD by the impedance network boundary conditions (INBCs). The FDTD-INBCs method permits avoidance of the huge amount of cells needed to model accurately the penetration in the traditional FDTD algorithm based on the utilization of the regular Yee grid. The method is applied to carry out the analysis of ESD events in some configurations
Keywords :
arcs (electric); electric impedance; electrostatic discharge; finite difference time-domain analysis; shielding; ESD; FDTD; Yee grid; conductive panels; electromagnetic field penetration; electrostatic discharge; finite-difference time domain; impedance network boundary conditions; shielding structures; strike arc; Boundary conditions; Electromagnetic fields; Electromagnetic modeling; Electrostatic discharge; Failure analysis; Finite difference methods; Impedance; Testing; Time domain analysis; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2000. Conference Record of the 2000 IEEE
Conference_Location :
Rome
ISSN :
0197-2618
Print_ISBN :
0-7803-6401-5
Type :
conf
DOI :
10.1109/IAS.2000.881176
Filename :
881176
Link To Document :
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