DocumentCode :
3594074
Title :
Degradation of high-power LEDs — Luminous flux and TM 21 life time
Author :
Ganev, Hristo ; Tran Quoc Khanh
Author_Institution :
Lab. of Lighting Technol., Tech. Univ. Darmstadt, Darmstadt, Germany
fYear :
2014
Firstpage :
141
Lastpage :
143
Abstract :
The reliability and the life time prediction are still one of the most important issues when we think about LEDs. The examination of these topics represents one of the goals of a joint project between research institutions and German lighting industry companies. We try to give answers to these questions using the state of the art approaches of accelerated life time tests and try to verify how the life time prediction methodology used at the moment fits with reality.
Keywords :
LED lamps; life testing; lighting; reliability; German lighting industry companies; TM 21 life time; accelerated life time tests; high-power LED degradation; life time prediction; life time prediction methodology; luminous flux; reliability; Aging; Current measurement; Degradation; Image color analysis; Light emitting diodes; Lighting; Standards;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Lighting (SSLCHINA), 2014 11th China International Forum on
Print_ISBN :
978-1-4799-6696-7
Type :
conf
DOI :
10.1109/SSLCHINA.2014.7127241
Filename :
7127241
Link To Document :
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