• DocumentCode
    3594307
  • Title

    High-resolution alpha-particle spectroscopy with an hybrid SiC/GaN detector/front-end detection system

  • Author

    Pullia, A. ; Bertuccio, G. ; Maiocchi, D. ; Caccia, S. ; Zocca, F.

  • Author_Institution
    Milan Univ., Milan
  • Volume
    2
  • fYear
    2007
  • Firstpage
    1516
  • Lastpage
    1520
  • Abstract
    An alpha-particle spectrometer has been assembled, consisting of an epitaxial 50 mum thick 4H silicon carbide detector connected to a gallium nitride HEMT used as input transistor of the front-end electronics. The depleted layer of the SiC diode detector was sufficient to stop all alpha particles of the used emitter in the 4.8-MeV to 5.8-MeV energy range. An excellent energy resolution of ~0.9% has been obtained in this energy range at a temperature of 55degC, which is comparable to that of single-crystal diamond detectors. The energy-resolution limiting factor is found to be the dispersion of the energy loss in the gold Schottky contact, which acts as entrance window to the detector. We used a gallium nitride (GaN) front-end transistor because this material offers two important advantages against silicon: (i) it can be grown on SiC substrates so as to realize SiC/GaN integrated systems, (ii) it is a wide band-gap semiconductor and therefore is intrinsically more adequate for room and above-room temperature operation. SiC-detector spectrometers are interesting in many nuclear application where the operation environment is hostile, both in terms of ionising radiation contamination and of high temperatures. Such applications include monitoring of ionising radiations in nuclear power plants and beam diagnostic in fundamental nuclear physics experiments.
  • Keywords
    III-V semiconductors; Schottky barriers; alpha-particle detection; alpha-particle spectroscopy; energy loss of particles; gallium compounds; gold; high electron mobility transistors; hybrid integrated circuits; nuclear electronics; radiation monitoring; semiconductor counters; silicon compounds; wide band gap semiconductors; 4H silicon carbide detector; Au; SiC diode detector; SiC substrates; SiC-GaN; SiC-GaN integrated systems; beam diagnostics; energy loss; energy-resolution limiting factor; front-end electronics; front-end transistor; fundamental nuclear physics experiments; gallium nitride HEMT; gold Schottky contact; high-resolution alpha-particle spectroscopy; hybrid detector; ionising radiation contamination; nuclear application; nuclear power plants; radiation monitoring; room temperature operation; single-crystal diamond detectors; size 50 mum; temperature 293 K to 298 K; temperature 55 C; wide band-gap semiconductor; Assembly; Detectors; Gallium nitride; HEMTs; III-V semiconductor materials; Ionizing radiation; Silicon carbide; Spectroscopy; Temperature; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-0922-8
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2007.4437287
  • Filename
    4437287