DocumentCode :
3594354
Title :
The growth of modern interferometry for industrial inspection
Author :
Burton, D.R. ; Lalor, M.J. ; Atkinson, J.T.
Author_Institution :
Liverpool Polytech., UK
fYear :
1991
fDate :
2/19/1991 12:00:00 AM
Firstpage :
42430
Lastpage :
42433
Abstract :
Two major developments in interferometry are discussed. One is the availability of cheap reliable He-Ne lasers, which have replaced expensive, unreliable and unwieldy sources with a device with is compact and cheap. The most recent product, coherent laser diodes, give extremely robust and reliable sources in a very small semiconductor package. The other development is the growth of computer technology, which has made high speed digital image processing available at low cost to most workers in the field. The analysis of interferograms is an algorithmic issue
Keywords :
automatic optical inspection; computerised instrumentation; computerised picture processing; gas lasers; light interferometry; He-Ne lasers; coherent laser diodes; computer technology; high speed digital image processing; industrial inspection; interferometry; semiconductor package;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Active and Passive Techniques for 3-D Vision, IEE Colloquium on
Type :
conf
Filename :
181134
Link To Document :
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