Title :
Multilayer material analysis using an active millimeter wave imaging system
Author :
Klenner, Mathias ; Zech, Christian ; Hulsmann, A. ; Tessmann, A. ; Leuther, A. ; Schlechtweg, Michael ; Wagner, Jens ; Ambacher, Oliver
Author_Institution :
Fraunhofer Inst. for Appl. Solid State Phys. (IAF), Freiburg im Breisgau, Germany
Abstract :
In this paper we demonstrate an active millimeter wave imaging system which is able to analyze the multilayer structure of dielectric materials with respect to defects such as voids or delamination. The system is based on an ultra wide band FMCW radar with two frequency multipliers from 8 GHz to 96 GHz and an I/Q heterodyne receiver operating at W-band. These circuits have been fabricated in-house using our 100 nm InGaAs mHEMT process [1].
Keywords :
CW radar; FM radar; dielectric materials; frequency multipliers; gallium arsenide; high electron mobility transistors; indium compounds; millimetre wave devices; millimetre wave imaging; ultra wideband radar; I-Q heterodyne receiver; InGaAs; W-band; active millimeter wave imaging system; delamination; dielectric materials; frequency 8 GHz to 96 GHz; frequency multipliers; mHEMT process; multilayer material analysis; multilayer structure; size 100 nm; ultra wide band FMCW radar; voids; Dielectric materials; Imaging; Millimeter wave radar; Nonhomogeneous media; Radio frequency; Receivers;
Conference_Titel :
Radar Symposium (IRS), 2013 14th International
Print_ISBN :
978-1-4673-4821-8
